Automated and compact tabletop Free Space Measurement Systems

  • ASTM D4935 Coaxial fixtures
  • Dual TEM Cells
  • Antenna Pattern Measurement Systems
  • Precise RF and microwave measurement

Microwave
Measurement
Systems

Microwave Measurement Systems, LLC designs and develops Free Space Systems for microwave and millimeter-wave characterization of electromagnetic properties of materials.

Now, inhomogeneous materials can be accurately measured at multiple points. Materials that cannot be cut precisely can be accurately measured. Curved samples can be accurately measured. All the usual obstacles to precise microwave measurement are removed by MMS free space systems.

Contact us to learn how we can meet your microwave measurement needs.

Measurement Systems

Microwave Measurement Systems provides a turnkey system for materials scientists. Materials development proceeds much faster with quick, easy characterization of samples at each stage of development: Examples – microwave absorbers, shielding materials, high temperature microwave ceramics, substrates used in high frequency circuits, military materials for devices that need to be qualified for the -40°C-150°C, etc.

MMS systems allow in situ inspection of objects. MMS also customizes systems to provide automated or manual measurement systems for all materials, independent of sample size and shape – Example: Radomes.

Why Choose MMS

MMS solutions avoid the problems of traditional RF and microwave measurement techniques:

Expensive anechoic chambers are not necessary.

Free space measurement is nondestructive and contactless, allowing accurate measurement in high and low temperature conditions.

Elaborate sample preparation is a thing of the past. One sample can be measured at all frequencies, and measurement can even be done in situ.

Full TRL calibration for precise amplitude and phase measurements.

Accurate measurement can be carried out by users from any discipline. No precise machining of samples, no high level skills required to interpret and analyze results.

Oblique incidence and arbitrary polarizations can be studied.